Materials Issues for Tunable RF and Microwave Devices
Volume 603
£25.99
Part of MRS Proceedings
- Editors:
- Quanxi Jia, Los Alamos National Laboratory
- Félix A. Miranda, NASA Glenn Research Center, Ohio
- Daniel E. Oates, Lincoln Laboratory, Massachusetts
- Xiaoxing Xi, Pennsylvania State University
- Reprinted: June 2014
- Date Originally Published: August 2000
- availability: Available
- format: Paperback
- isbn: 9781107413238
£
25.99
Paperback
Looking for an inspection copy?
This title is not currently available on inspection
-
Electric or magnetic tunability of RF and microwave devices is desirable for a variety of civilian and military applications. Tremendous advances have been made in thin-film processing, in particular with metal-oxide thin films. Consequently, it has been recognized that the integration of nonlinear dielectric, ferrite, colossal magnetoresistive (CMR) ferromagnetic, and superconductor materials could revolutionize tunable devices by providing capabilities while significantly reducing size and cost. Crucial issues facing this technology concern the material properties, in particular, the loss in thin films of the tunable materials. Extensive efforts are being devoted to understand the tuning and loss mechanisms, improve thin-film processing and characterization, develop new materials, and design novel device concepts. This book, first published in 2000, serves as a reference for researchers and contributes to breakthroughs in basic and applied research in this field. Topics include: frequency-agile materials for electronics; electric-field tuning; magnetic-field tuning; high-frequency applications for ferroelectrics; ferroelectrics; magnetics and others; fundamentals and materials characterization.
Customer reviews
Not yet reviewed
Be the first to review
Review was not posted due to profanity
×Product details
- Reprinted: June 2014
- Date Originally Published: August 2000
- format: Paperback
- isbn: 9781107413238
- length: 316 pages
- dimensions: 229 x 152 x 17 mm
- weight: 0.43kg
- availability: Available
Sorry, this resource is locked
Please register or sign in to request access. If you are having problems accessing these resources please email [email protected]
Register Sign in» Proceed
You are now leaving the Cambridge University Press website. Your eBook purchase and download will be completed by our partner www.ebooks.com. Please see the permission section of the www.ebooks.com catalogue page for details of the print & copy limits on our eBooks.
Continue ×Are you sure you want to delete your account?
This cannot be undone.
Thank you for your feedback which will help us improve our service.
If you requested a response, we will make sure to get back to you shortly.
×