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Look Inside Degradation Processes in Nanostructured Materials

Degradation Processes in Nanostructured Materials

Volume 887

£30.99

Part of MRS Proceedings

  • Date Published: April 2006
  • availability: Available
  • format: Hardback
  • isbn: 9781558998414

£ 30.99
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About the Authors
  • As more advanced materials find their way into daily life, a better understanding of degradation processes is required, allowing us to more accurately predict their lifetime and further increase their performance, reliability. While degradation processes are initiated at molecular (subnanometer) scale, the nanostructure and nanoconfinement of materials alter the degradation processes occurring in materials at micron or larger scales, and eventually trigger new degradation routes. This book studies the effect of nanometer-scale structure and confinement on degradation processes and analyzes the experimental and theoretical approaches used to estimate the lifetime of nanostructured and nanoconfined materials in various environments. Various topics are addressed - from electronic, optical, structural, and magnetic nanomaterials to space, chemical, biological and medical applications. There is also an emphasis on the time dependence associated with artificial treatments involving electrical currents, annealing, and irradiation by various sources, such as gamma radiation and ions.

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    Product details

    • Date Published: April 2006
    • format: Hardback
    • isbn: 9781558998414
    • length: 269 pages
    • dimensions: 234 x 155 x 20 mm
    • weight: 0.5kg
    • availability: Available
  • Table of Contents

    Part I. Degradation Processes in Carbon Nanotubes
    Part II. Degradation Processes in Polymer-nanofiller Composites
    Part III. Nanometer-scale Degradation Processes in Magnetic and Superconducting Materials
    Part IV. Degradation Processes Induced by Particles and Ionizing Radiation
    Part V. Degradation Processes at Nanometer Scale
    Author index
    Subject index.

  • Editors

    Mircea Chipara, Indiana University

    Orazio Puglisi, Università degli Studi di Catania, Italy

    Ralph Skomski, University of Nebraska, Lincoln

    Frank R. Jones, University of Sheffield

    Benjamin S. Hsiao, State University of New York, Stony Brook

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