A wide variety of applications ranging from microelectronics to turbines for propulsion and power generation rely on films, coatings, and multilayers to improve performance. As such, the ability to predict coating failure - such as delamination (debonding), mud-cracking, blistering, crack kinking, and the like - is critical to component design and development. This work compiles and organizes decades of research that established the theoretical foundation for predicting such failure mechanisms, and clearly outlines the methodology needed to predict performance. Detailed coverage of cracking in multilayers is provided, with an emphasis on the role of differences in thermoelastic properties between the layers. The comprehensive theoretical foundation of the book is complemented by easy-to-use analysis codes designed to empower novices with the tools needed to simulate cracking; these codes enable not only precise quantitative reproduction of results presented graphically in the literature, but also the generation of new results for more complex multilayered systems.
- Suitable as a reference for key results for those familiar with the concepts but not experts in the specifics
- Suitable for experts in the field teaching graduate courses on the subject or as reference for coverage in broader courses
- Users can obtain precise numbers typically reported only graphically in the literature
Read more
Customer reviews

Not yet reviewed
Be the first to review

Log in to review

Review was not posted due to profanity
×

, create a review

(If you're not , sign out)

Please enter the right captcha value

Please enter a star rating.

Your review must be a minimum of 12 words.

How do you rate this item?

Reviews must contain at least 12 words about the product.

×

Product details
- Date Published: March 2017
- format: Hardback
- isbn: 9781107131866
- length: 288 pages
- dimensions: 260 x 182 x 17 mm
- weight: 0.74kg
- availability: Available
Table of Contents
1. Introduction
2. Key mechanics concepts
3. Fracture mechanics
4. Bilayers
5. Multilayers
6. Channeling/tunneling cracks
7. Kinking
8. Penetration vs deflection vs arrest
9. Edge and corner interface cracks
10. Buckling delamination
11. Thin strips (patterned lines)
12. Steady-state temperature gradients
13. Cracking due to temperature transients
14. Software for steady-state delamination
15. Software for transient behavior
16. FEA software for multilayers
17. Convergence and benchmarks with LS-FEA.
Look Inside

General Resources

Resources

Find resources associated with this title

Back to resources home

Type	Name	Unlocked *	Format	Size

Showing of

This title is supported by one or more locked resources. Access to locked resources is granted exclusively by Cambridge University Press to lecturers whose faculty status has been verified. To gain access to locked resources, lecturers should sign in to or register for a Cambridge user account.

Please use locked resources responsibly and exercise your professional discretion when choosing how you share these materials with your students. Other lecturers may wish to use locked resources for assessment purposes and their usefulness is undermined when the source files (for example, solution manuals or test banks) are shared online or via social networks.

Supplementary resources are subject to copyright. Lecturers are permitted to view, print or download these resources for use in their teaching, but may not change them or use them for commercial gain.

If you are having problems accessing these resources please contact [email protected].

Authors
Matthew R. Begley, University of California, Santa Barbara
Professor Matthew R. Begley is recognized for seminal contributions in the mechanics of multilayered systems, with an emphasis on computational aspects of the required analysis. His codes are employed in some industries to design experiments, assess current designs and evaluate novel multilayer systems for improved performance. He is widely sought after for consulting work on the mechanics of thin films, coatings and multilayers, by companies such as General Electric, Pratt and Whitney, Intel, Sunpower, Raytheon and Areva.
John W. Hutchinson, Harvard University, Massachusetts
Professor John W. Hutchinson is a member of the US National Academies of Engineering and Sciences and a Foreign Member of the Royal Society of London. He is one of the leading experts in the mechanics of thin film systems, with a number of highly cited, seminal journal papers on the subject. Hutchinson is credited with generating many of the conceptual developments in this field, as well as illustrations of those concepts to applications such as microelectronics, thermal barrier coatings, microfluidic devices and hypersonics.

This title is available for institutional purchase via Cambridge Core

Related Books

Fluid Film Lubrication

Electronic Thin-Film Reliability

Thin Film Materials

Stress, Defect Formation and Surface Evolution

Foundations and Applications of Engineering Mechanics

related journals

Powder Diffraction

Powder Diffraction is a quarterly journal published by the JCPDS-International Centre for Diffraction Data through…

Products and services

About us

Careers

Unlocking potential with the best learning and research solutions

The Mechanics and Reliability of Films, Multilayers and Coatings

£93.99