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Look Inside Dislocations and Deformation Mechanisms in Thin Films and Small Structures

Dislocations and Deformation Mechanisms in Thin Films and Small Structures

Volume 673

$39.99 (C)

Part of MRS Proceedings

  • Date Published: September 2001
  • availability: Available
  • format: Hardback
  • isbn: 9781558996090

$ 39.99 (C)
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  • The mechanical properties of small volumes of materials such as thin films and patterned structures can be very different from the mechanical properties of those same materials in bulk. Many explanations of the mechanical behaviors of such small volumes have depended on simplified models of dislocation behavior. However, recent developments in dislocation modeling have made it possible to understand dislocation behavior in much more detail than before. A wide range of topics is presented in these proceedings, including mechanisms of plastic deformation in heteroepitaxial, multilayered and polycrystalline thin films, as well as three-dimensional mesostructures such as epitaxial islands, semiconducting devices and microcrystallites. Experimental, theoretical and numerical simulations are addressed. Topics include: dislocation and deformation mechanisms in thin metal films and multilayers; discrete dislocations - observations and simulations; dislocations and deformation mechanisms in thin films and small structures; dislocations in small structures; dislocations and deformation in epitaxial layers; dislocation fundamentals -observations, calculations and simulations.

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    Product details

    • Date Published: September 2001
    • format: Hardback
    • isbn: 9781558996090
    • length: 248 pages
    • dimensions: 228 x 152 mm
    • weight: 0.455kg
    • availability: Available
  • Table of Contents

    Part I. Dislocation and Deformation Mechanisms in Thin Metal Films and Multilayers I
    Part II. Discrete Dislocations: Observations and Simulations
    Part III. Dislocations and Deformation Mechanisms in Thin Films and Small Structures
    Part IV. Dislocations in Small Structures
    Part V. Dislocations and Deformation in Epitaxial Layers
    Part VI. Dislocation Fundamentals: Observations, Calculations and Simulations
    Part VII. Dislocations and Deformation Mechanisms in Thin Metal Films and Multilayers II
    Author index
    Subject index.

  • Editors

    Oliver Kraft, Max-Planck-Institut für Metallforschung, Germany

    Klaus W. Schwarz, IBM T J Watson Research Center, New York

    Shefford P. Baker, Cornell University, New York

    L. Ben Freund, Brown University, Rhode Island

    Robert Hull, University of Virginia

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