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Look Inside Silicon Carbide 2008 — Materials, Processing and Devices

Silicon Carbide 2008 — Materials, Processing and Devices

Volume 1069

£81.99

Part of MRS Proceedings

  • Date Published: July 2008
  • availability: Available
  • format: Hardback
  • isbn: 9781605110394

£ 81.99
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About the Authors
  • Silicon carbide (SiC) is a robust semiconductor material being actively developed for high-power and high-temperature applications, especially in the field of power electronics and sensors for harsh environments. This book, the fifth in a continuing series, focuses on SiC growth, defects, and devices. New developments in the growth of bulk SiC single-crystal materials, advances in the epitaxial growth of SiC, and progress in the characterization of materials properties and defects in SiC are featured. The volume also highlights the development of devices manufactured on this wide-bandgap semiconductor including: innovative device designs; characterization of device and materials properties; and improvements in wide-bandgap processing technology.

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    Product details

    • Date Published: July 2008
    • format: Hardback
    • isbn: 9781605110394
    • length: 283 pages
    • dimensions: 228 x 152 mm
    • weight: 0.518kg
    • availability: Available
  • Table of Contents

    Part I. Bulk Material and Characterization
    Part II. Epitaxial Material and Characterization
    Part III. Device Processing and Characterization
    Author index
    Subject index.

  • Editors

    Michael Dudley, Stony Brook University, State University of New York

    C. Mark Johnson, University of Nottingham

    Adrian R. Powell, Cree, Carolina

    Sei-Hyung Ryu, Cree, Carolina

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