Electrically Based Microstructural Characterization III
Volume 699
$35.99 (C)
Part of MRS Proceedings
- Editors:
- Rosario A. Gerhardt, Georgia Institute of Technology
- Andrew P. Washabaugh, JENTEK Sensors, Inc. Massachusetts
- M. A. Alim, Alabama Agricultural and Mechanical University
- Gyeong Man Choi, Pohang University of Science and Technology, Republic of Korea
- Reprinted: June 2014
- Date Originally Published: September 2002
- availability: Temporarily unavailable - available from TBC
- format: Paperback
- isbn: 9781107412026
$
35.99
(C)
Paperback
Other available formats:
Hardback
Looking for an examination copy?
This title is not currently available for examination. However, if you are interested in the title for your course we can consider offering an examination copy. To register your interest please contact [email protected] providing details of the course you are teaching.
-
This book, first published in 2002, focuses on the application of electrical measurements as a nondestructive tool for microstructural characterization. Papers show how the usage of dc- and ac- resistivity measurements, complex impedance analysis, ellipsometry, and capacitance-voltage measurements are used to assess phase transformations, presence of grain boundary layers with different electrical response, anisotropy, mechanical degradation, and presence of defects and porosity in a wide range of materials and devices. The development of scanning impedance imaging by applying a lateral bias to an AFM specimen opens up many opportunities for simultaneous electrical property and microstructural data acquisition. This is the first time that impedance spectroscopy has been used to characterize metallic alloys in the metallic state, in the absence of liquid electrolytes. Papers focus on characterizing components in various microelectronic devices, with an emphasis on materials interpretation rather than device interpretation. Topics include: electrically inhomogeneous materials; advances in experimental methods and interpretation; microelectronic applications; metals and alloys and amorphous materials.
Customer reviews
Not yet reviewed
Be the first to review
Review was not posted due to profanity
×Product details
- Reprinted: June 2014
- Date Originally Published: September 2002
- format: Paperback
- isbn: 9781107412026
- length: 374 pages
- dimensions: 229 x 152 x 20 mm
- weight: 0.5kg
- availability: Temporarily unavailable - available from TBC
Sorry, this resource is locked
Please register or sign in to request access. If you are having problems accessing these resources please email [email protected]
Register Sign in» Proceed
You are now leaving the Cambridge University Press website. Your eBook purchase and download will be completed by our partner www.ebooks.com. Please see the permission section of the www.ebooks.com catalogue page for details of the print & copy limits on our eBooks.
Continue ×Are you sure you want to delete your account?
This cannot be undone.
Thank you for your feedback which will help us improve our service.
If you requested a response, we will make sure to get back to you shortly.
×